8:30am-4:30pm, Monday, May 21, 2018, Sheraton Albuquerque Airport Hotel, Albuquerque, NM
- Learn basic principles of two major surface analytical methods – XPS and AES
- Learn capabilities and limitations of techniques
- Discover types of applications of XPS and AES
- Learn good practices of quantitative surface analysis
The course discusses fundamental approach towards surface analytical methods. The basic principles of XPS will be discussed along with approaches towards qualitative and quantitative analysis. Benefits of chemical analysis will be discussed in details. The state of the art types of commercial instrumentation available will be introduced. Types of analytical data, i.e. large and small area spectroscopy, depth profiling, and imaging will be presented. Examples of the use of XPS with many types of materials and to diverse kinds of problems (eg. surface contamination, corrosion, catalysis, failure analysis, metrology) will be presented. Good practices for spectra processing and data analysis will be discussed as well.
In the second section, basic principles of AES will be discussed along with limitations and advantages of this method for different applications. Auger mapping capabilities will be demonstrated for several examples.
Who Should Attend?
Scientists, engineers, technicians, and students who desire a practical, current understanding of XPS and AES.
Instructor: Kateryna Artyushkova, University of New Mexico
Kateryna Artyushkova is a Research Associate Professor at Chemical and Biological Engineering Department at the University of New Mexico and Associate Director for Center for Microegnineered Materials. Her research focuses on developing a methodology for accelerating material design through structure-to-property modeling and characterization of functional materials using ex-situ and in-situ spectroscopic and microscopic techniques. She has received M.A. Degree with Honors in Chemistry from the National Technical University of Ukraine, Kiev in 1995. She obtained her Ph.D. in Chemistry from Kent State University in December of 2001 under the supervision of Julia E. Fulghum. She has more than 15 years of experience with all aspects of X-ray photoelectron spectroscopy, including instrumentation, experimental design for optimizing time and information content, and data analysis. She has co-authored 150+ peer-reviewed publications and four book chapters. She is a chair of Applied Surface Science Division of AVS, past chair of NM AVS chapter and a Science Fair Chair of NM AVS. She is a North American Editor of Surface and Interface Analysis Journal.