Measuring and Characterizing Surface Topography

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8:30am-4:30pm, Thursday, May 26, 2016, Sheraton Albuquerque Airport Hotel, Albuquerque, NM

Course Objectives

  • Describe surface topography, surface metrology, and surface finish
  • Describe effects of topography on performance
  • Understand symbols used in mechanical drawings on surface finish
  • Find major national and international standards used in specifying surface finish
  • Describe different parameters used in evaluation of surface texture
  • Understand different methods used in measuring surface topography, and the resulting evaluation of surface texture
  • Obtain resources for deeper understanding of surface texture and measuring surface texture

Course Description

Surfaces cover everything—and they influence behavior and performance of parts. In this tutorial, we will focus on the topography of surfaces—the texture and roughness. Texture includes both short spatial wavelength components (what one would call roughness) and longer wavelength components (what one would call waviness and form).  Texture may have directionality (lay).  These qualities are specified in mechanical product drawings, and the evaluation of roughness is defined in both ASME and ISO standards.  This tutorial provides an introduction to surface metrology and to the evaluation of roughness. As an outcome, you will understand the fundamentals of surface metrology, including vocabulary, definitions, drawing symbols, evaluation methods, and both contact and non-contact equipment used in measuring surface topography.

Who Should Attend?

Technicians, scientists, engineers, or managers who are interested in surface topography and surface finish.

Instructor:  Hy Tran, Sandia National Laboratories

Hy D. Tran is a Senior Scientist/Engineer at Sandia National Laboratories in the Primary Standards Laboratory. His duties include evaluating, reviewing, and approving calibration methods and procedures, and helping set strategic directions for Sandia’s metrology research. Additionally, he is a team member on the measurement assurance programs at Sandia and serves on assessment teams of Department of Energy calibration labs according to ISO 17025. His technical contributions at Sandia include mapping of the Moore M-48 coordinate measuring machine at Sandia, developing the Sandia silicon micromachined mesoscale hybrid calibration artifact, which received a R&D 100 award in 2008, and mentoring student projects at the Primary Standards Laboratory. He has been a principal investigator for many Laboratory Directed Research and Development (LDRD) projects and serves on internal LDRD review committees. In addition to serving on ASME metrology standards committees and ISO standards working groups, he also serves as a program evaluation volunteer for ABET, on the Fundamentals of Engineering committee for the National Council of Examiners for Engineering and Surveying (NCEES), and as Vice President for Learning and Development for NCSLI.  Dr. Tran earned two B.S. degrees (in life sciences and mechanical engineering) from the Massachusetts Institute of Technology, and an M.S. and Ph.D. from Stanford University, both in mechanical engineering, and is a licensed professional engineer.

Course Materials

Course Notes

Cost: $575.00

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